Background
An electronic
component is subjected to a voltage stress, starting at 2V (use stress level)
and increasing to 7V in stepwise increments as shown in
Figure
1. The
following steps, in hours, are used to apply stress to the products
under test: 0 to 250, 2V; 250 to 350, 3V; 350 to 370, 4V; 370 to
380, 5V; 380 to 390, 6V; and 390 to 400, 7V.
The objective of this test is to determine the B(10) life and the
mean life (often called "mean time to failure," MTTF or
MTBF) of these components at the normal use stress level of 2V.
In this experiment, the overall test time is 385 hr. If the
test were performed at use conditions, one would expect the test
duration to be approximately 1700 hr if the test were run until all units
failed.
Experiment
and Data
Eleven units are available for the test. All eleven
units are tested using the same stress profile. Units that fail are removed from the test and their total time on test
recorded. The following times-to-failure are observed in the test,
in hours: 280, 310, 330, 352, 360, 366, 371, 374, 378, 381 and 385.
Analysis
Step 1: Using ALTA 7 PRO, the analyst begins by creating
a new project with a Standard Folio for ungrouped times-to-failure data
with voltage as the stress type and setting the use stress level as 2V, as shown in
Figure 2.
Step 2: After creating the Data Sheet, the analyst
adds a new Stress Profile to the project, defines the Stress Profile and
renames it as "Voltage Step."
In a Stress Profile, you can define a time-varying stress
in segments. The stress applied during these segments can be a constant value (as is the
case in this step example) or defined as a function of a time variable (t).
The stress profile for this analysis is displayed in
Figure
3.
Step 3: The analyst selects the cumulative damage
life-stress model and the Weibull distribution, then uses the Stress
Transformation window to specify Logarithmic (Power LSR) as the
transformation to be applied to the Voltage stress, as shown in Figure 4.
Step 4: Figure
5 displays the ALTA Standard Folio with the analysis options
selected (cumulative damage
life-stress model and Weibull for the underlying life distribution)
and the times-to-failure data entered. Notice that the Voltage Step Stress
Profile has been assigned to
each data point. Figure 5A displays the method
for assigning the appropriate time-dependent stress profile to a data point
in ALTA.
After entering the data and selecting the appropriate analysis options,
the analyst clicks Calculate to estimate the parameters. It is that
simple! At this point, the analysis is complete. Multiple plots and
reports are available to ascertain the adequacy of fit as well as
visualize the results, and compute the required values.
Step
5: Figure 6 displays the
B(10) life and mean
life at the 2V use stress level, calculated with ALTA's Quick
Calculation Pad (QCP). ALTA contains many other tools for
obtaining results and reports for your analyses.
Figure
6A and Figure 6B display a use level
probability plot and a Cox-Snell Residuals plot for the analysis.